A new method for measuring alias-free aperture jitter in an ADC output - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Takahiro J. Yamaguchi, Katsuhiko Degawa, Masayuki Kawabata, Masahiro Ishida, Koichiro Uekusa, Mani Soma. A new method for measuring alias-free aperture jitter in an ADC output. In 2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015. pages 1-6, IEEE, 2015. [doi]

This author has not been identified. Look up 'Takahiro J. Yamaguchi' in GoogleThis author has not been identified. Look up 'Katsuhiko Degawa' in GoogleThis author has not been identified. Look up 'Masayuki Kawabata' in GoogleThis author has not been identified. Look up 'Masahiro Ishida' in GoogleThis author has not been identified. Look up 'Koichiro Uekusa' in GoogleThis author has not been identified. Look up 'Mani Soma' in Google

runs on WebDSL