Takahiro J. Yamaguchi, Kiyotaka Ichiyama, X. H. Hou, Masahiro Ishida. A robust method for identifying a deterministic jitter model in a total jitter distribution. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.