Takahiro J. Yamaguchi, Mani Soma, Masahiro Ishida, Hirobumi Musha, Louis Malarsie. A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 717-725, IEEE Computer Society, 2002. [doi]
Abstract is missing.