Testing clock distribution circuits using an analytic signal method

Takahiro J. Yamaguchi, Mani Soma, Jim Nissen, David Halter, Rajesh Raina, Masahiro Ishida. Testing clock distribution circuits using an analytic signal method. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 323-331, IEEE Computer Society, 2001. [doi]

Abstract

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