Ken-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara. BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 313-318, IEEE Computer Society, 2001. [doi]
Abstract is missing.