SRAM Circuit With Expanded Operating Margin and Reduced Stand-By Leakage Current Using Thin-BOX FD-SOI Transistors

Masanao Yamaoka, Ryuta Tsuchiya, Takayuki Kawahara. SRAM Circuit With Expanded Operating Margin and Reduced Stand-By Leakage Current Using Thin-BOX FD-SOI Transistors. J. Solid-State Circuits, 41(11):2366-2372, 2006. [doi]

@article{YamaokaTK06,
  title = {SRAM Circuit With Expanded Operating Margin and Reduced Stand-By Leakage Current Using Thin-BOX FD-SOI Transistors},
  author = {Masanao Yamaoka and Ryuta Tsuchiya and Takayuki Kawahara},
  year = {2006},
  doi = {10.1109/JSSC.2006.882891},
  url = {https://doi.org/10.1109/JSSC.2006.882891},
  researchr = {https://researchr.org/publication/YamaokaTK06},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {41},
  number = {11},
  pages = {2366-2372},
}