Robust Readout Circuit with Leakage Current Cancellation Technique for Stretchable Touch Sensors

Kaoru Yamashita, Tokihiko Shimura, Shun Sato, Naoji Matsuhisa, Hiroki Ishikuro. Robust Readout Circuit with Leakage Current Cancellation Technique for Stretchable Touch Sensors. In 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021. pages 1-5, IEEE, 2021. [doi]

Abstract

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