Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Hironobu Yotsuyanagi, Masaki Hashizume, Kewal K. Saluja. Diagnosing Resistive Open Faults Using Small Delay Fault Simulation. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013. pages 79-84, IEEE, 2013. [doi]
@inproceedings{YamazakiTTHYHS13,
title = {Diagnosing Resistive Open Faults Using Small Delay Fault Simulation},
author = {Koji Yamazaki and Toshiyuki Tsutsumi and Hiroshi Takahashi and Yoshinobu Higami and Hironobu Yotsuyanagi and Masaki Hashizume and Kewal K. Saluja},
year = {2013},
doi = {10.1109/ATS.2013.23},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2013.23},
researchr = {https://researchr.org/publication/YamazakiTTHYHS13},
cites = {0},
citedby = {0},
pages = {79-84},
booktitle = {22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013},
publisher = {IEEE},
}