Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Hironobu Yotsuyanagi, Masaki Hashizume, Kewal K. Saluja. Diagnosing Resistive Open Faults Using Small Delay Fault Simulation. In 22nd Asian Test Symposium, ATS 2013, Yilan County, Taiwan, November 18-21, 2013. pages 79-84, IEEE, 2013. [doi]
Abstract is missing.