Hiroshi Yamazaki, Motohiro Wakazono, Toshinori Hosokawa, Masayoshi Yoshimura. A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution. IEICE Transactions, 96-D(9):1994-2002, 2013. [doi]
@article{YamazakiWHY13-0,
title = {A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution},
author = {Hiroshi Yamazaki and Motohiro Wakazono and Toshinori Hosokawa and Masayoshi Yoshimura},
year = {2013},
url = {http://search.ieice.org/bin/summary.php?id=e96-d_9_1994},
researchr = {https://researchr.org/publication/YamazakiWHY13-0},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {96-D},
number = {9},
pages = {1994-2002},
}