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Hiroshi Yamazaki, Motohiro Wakazono, Toshinori Hosokawa, Masayoshi Yoshimura. A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution. IEICE Transactions, 96-D(9):1994-2002, 2013. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A don't care identification method for test compactionHiroshi Yamazaki, Motohiro Wakazono, Toshinori Hosokawa, Masayoshi Yoshimura. ddecs 2013: 215-218 [doi] A Capture Safe Static Test Compaction Method Based on Don't CaresSayuri Ochi, Hiroshi Yamazaki, Toshinori Hosokawa, Masayoshi Yoshimura. iolts 2018: 195-200 [doi]
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