Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato. An Approach to Improve the Resolution of Defect-Based Diagnosis. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 123, IEEE Computer Society, 2001. [doi]
Abstract is missing.