BiSPD-YOLO: Surface Defect Detection Method for Small Features and Low-resolution Images - researchr publication authors

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Sixu Yan, Gaoming Chen, Ao Gao, Chao Liu, Zhenhua Xiong. BiSPD-YOLO: Surface Defect Detection Method for Small Features and Low-resolution Images. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2023, Seattle, WA, USA, June 28-30, 2023. pages 709-714, IEEE, 2023. [doi]

This author has not been identified. Look up 'Sixu Yan' in GoogleThis author has not been identified. Look up 'Gaoming Chen' in GoogleThis author has not been identified. Look up 'Ao Gao' in GoogleThis author has not been identified. Look up 'Chao Liu' in GoogleThis author has not been identified. Look up 'Zhenhua Xiong' in Google

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