Sixu Yan, Gaoming Chen, Ao Gao, Chao Liu, Zhenhua Xiong. BiSPD-YOLO: Surface Defect Detection Method for Small Features and Low-resolution Images. In IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2023, Seattle, WA, USA, June 28-30, 2023. pages 709-714, IEEE, 2023. [doi]
Abstract is missing.