Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique - researchr publication authors

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Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo. Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. In IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018. pages 49-54, IEEE, 2018. [doi]

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