Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo. Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. In IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018. pages 49-54, IEEE, 2018. [doi]
@inproceedings{YanCHFYG18,
title = {Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique},
author = {Aibin Yan and Zhile Chen and Zhengfeng Huang and Xiangsheng Fang and Maoxiang Yi and Jing Guo},
year = {2018},
doi = {10.1109/ITC-Asia.2018.00019},
url = {https://doi.org/10.1109/ITC-Asia.2018.00019},
researchr = {https://researchr.org/publication/YanCHFYG18},
cites = {0},
citedby = {0},
pages = {49-54},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5180-3},
}