Ming Yan, Yici Cai, Chenguang Wang, Qiang Zhou. An Effective Power Grid Optimization Approach for the Electromigration Reliability. In 2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017, Bochum, Germany, July 3-5, 2017. pages 453-458, IEEE, 2017. [doi]
Abstract is missing.