Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS

Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Yiming Ouyang, Honghui Deng. Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS. Microelectronics Journal, 61:43-50, 2017. [doi]

Abstract

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