Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study

Haihua Yan, Adit D. Singh. Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 242-251, IEEE, 2004. [doi]

Authors

Haihua Yan

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Adit D. Singh

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