Haihua Yan, Adit D. Singh. Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 242-251, IEEE, 2004. [doi]
@inproceedings{YanS04:2,
title = {Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study},
author = {Haihua Yan and Adit D. Singh},
year = {2004},
doi = {10.1109/ITC.2004.70},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.70},
researchr = {https://researchr.org/publication/YanS04%3A2},
cites = {0},
citedby = {0},
pages = {242-251},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}