Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Haihua Yan, Adit D. Singh. A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI). IEEE Trans. VLSI Syst., 14(11):1216-1226, 2006. [doi]