Haihua Yan, Adit D. Singh. A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI). IEEE Trans. VLSI Syst., 14(11):1216-1226, 2006. [doi]
@article{YanS06,
title = {A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI)},
author = {Haihua Yan and Adit D. Singh},
year = {2006},
doi = {10.1109/TVLSI.2006.886415},
url = {http://dx.doi.org/10.1109/TVLSI.2006.886415},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/YanS06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {14},
number = {11},
pages = {1216-1226},
}