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Just-In-Time Defect Identification and Localization: A Two-Phase Framework

Meng Yan, Xin Xia 0001, Yuanrui Fan, Ahmed E. Hassan, David Lo 0001, Shanping Li. Just-In-Time Defect Identification and Localization: A Two-Phase Framework. IEEE Trans. Software Eng., 48(2):82-101, 2022. [doi]

Authors

Meng Yan

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Xin Xia 0001

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Yuanrui Fan

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Ahmed E. Hassan

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David Lo 0001

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Shanping Li

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