Just-In-Time Defect Identification and Localization: A Two-Phase Framework

Meng Yan, Xin Xia 0001, Yuanrui Fan, Ahmed E. Hassan, David Lo 0001, Shanping Li. Just-In-Time Defect Identification and Localization: A Two-Phase Framework. IEEE Trans. Software Eng., 48(2):82-101, 2022. [doi]

Abstract

Abstract is missing.