Meng Yan, Xin Xia 0001, Yuanrui Fan, Ahmed E. Hassan, David Lo 0001, Shanping Li. Just-In-Time Defect Identification and Localization: A Two-Phase Framework. IEEE Trans. Software Eng., 48(2):82-101, 2022. [doi]
@article{YanXFHLL22,
title = {Just-In-Time Defect Identification and Localization: A Two-Phase Framework},
author = {Meng Yan and Xin Xia 0001 and Yuanrui Fan and Ahmed E. Hassan and David Lo 0001 and Shanping Li},
year = {2022},
doi = {10.1109/TSE.2020.2978819},
url = {https://doi.org/10.1109/TSE.2020.2978819},
researchr = {https://researchr.org/publication/YanXFHLL22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {48},
number = {2},
pages = {82-101},
}