A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application - researchr publication authors

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Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang 0002, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. on Circuits and Systems, 66(2):287-291, 2019. [doi]

This author has not been identified. Look up 'Aibin Yan' in GoogleThis author has not been identified. Look up 'Kang Yang' in GoogleThis author has not been identified. Look up 'Zhengfeng Huang' in GoogleThis author has not been identified. Look up 'Jiliang Zhang 0002' in GoogleThis author has not been identified. Look up 'Jie Cui' in GoogleThis author has not been identified. Look up 'Xiangsheng Fang' in GoogleThis author has not been identified. Look up 'Maoxiang Yi' in GoogleThis author has not been identified. Look up 'Xiaoqing Wen' in Google

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