A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application - researchr publication

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Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang 0002, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. on Circuits and Systems, 66(2):287-291, 2019. [doi]

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