Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang 0002, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen. A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. on Circuits and Systems, 66(2):287-291, 2019. [doi]
@article{YanYHZCFYW19,
title = {A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application},
author = {Aibin Yan and Kang Yang and Zhengfeng Huang and Jiliang Zhang 0002 and Jie Cui and Xiangsheng Fang and Maoxiang Yi and Xiaoqing Wen},
year = {2019},
doi = {10.1109/TCSII.2018.2849028},
url = {https://doi.org/10.1109/TCSII.2018.2849028},
researchr = {https://researchr.org/publication/YanYHZCFYW19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {66},
number = {2},
pages = {287-291},
}