Image-based Process Monitoring via Adversarial Autoencoder with Applications to Rolling Defect Detection - researchr publication authors

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Hao Yan, Huai-Ming Yeh, Nurettin Sergin. Image-based Process Monitoring via Adversarial Autoencoder with Applications to Rolling Defect Detection. In 15th IEEE International Conference on Automation Science and Engineering, CASE 2019, Vancouver, BC, Canada, August 22-26, 2019. pages 311-316, IEEE, 2019. [doi]

This author has not been identified. Look up 'Hao Yan' in GoogleThis author has not been identified. Look up 'Huai-Ming Yeh' in GoogleThis author has not been identified. Look up 'Nurettin Sergin' in Google

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