Hao Yan, Huai-Ming Yeh, Nurettin Sergin. Image-based Process Monitoring via Adversarial Autoencoder with Applications to Rolling Defect Detection. In 15th IEEE International Conference on Automation Science and Engineering, CASE 2019, Vancouver, BC, Canada, August 22-26, 2019. pages 311-316, IEEE, 2019. [doi]
@inproceedings{YanYS19,
title = {Image-based Process Monitoring via Adversarial Autoencoder with Applications to Rolling Defect Detection},
author = {Hao Yan and Huai-Ming Yeh and Nurettin Sergin},
year = {2019},
doi = {10.1109/COASE.2019.8843313},
url = {https://doi.org/10.1109/COASE.2019.8843313},
researchr = {https://researchr.org/publication/YanYS19},
cites = {0},
citedby = {0},
pages = {311-316},
booktitle = {15th IEEE International Conference on Automation Science and Engineering, CASE 2019, Vancouver, BC, Canada, August 22-26, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0356-3},
}