Yuhang Yang, Zongwei Wang 0001, Haoran Wang, Lin Bao, Gaoqi Yang, YiMao Cai, Ru Huang 0001. Investigation and Mitigation of Transistor Induced Reliability Issues in 40NM RRAM Array. In IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025. pages 10, IEEE, 2025. [doi]
Abstract is missing.