Scan based methodology for reliable state retention power gating designs - researchr publication authors

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Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed. Scan based methodology for reliable state retention power gating designs. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 69-74, IEEE, 2010. [doi]

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