Sheng Yang, Bashir M. Al-Hashimi, David Flynn, S. Saqib Khursheed. Scan based methodology for reliable state retention power gating designs. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 69-74, IEEE, 2010. [doi]
@inproceedings{YangAFK10,
title = {Scan based methodology for reliable state retention power gating designs},
author = {Sheng Yang and Bashir M. Al-Hashimi and David Flynn and S. Saqib Khursheed},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5457233},
tags = {rule-based},
researchr = {https://researchr.org/publication/YangAFK10},
cites = {0},
citedby = {0},
pages = {69-74},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}