Fan Yang, Sreejit Chakravarty, Arun Gunda, Nicole Wu, Jianyu Ning. Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 101-106, IEEE Computer Society, 2014. [doi]
@inproceedings{YangCGWN14,
title = {Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests},
author = {Fan Yang and Sreejit Chakravarty and Arun Gunda and Nicole Wu and Jianyu Ning},
year = {2014},
doi = {10.1109/ATS.2014.29},
url = {http://dx.doi.org/10.1109/ATS.2014.29},
researchr = {https://researchr.org/publication/YangCGWN14},
cites = {0},
citedby = {0},
pages = {101-106},
booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6030-9},
}