Fan Yang, Sreejit Chakravarty, Arun Gunda, Nicole Wu, Jianyu Ning. Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 101-106, IEEE Computer Society, 2014. [doi]
Abstract is missing.