A body-biasing of readout circuit for STT-RAM with improved thermal reliability - researchr publication authors

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Lun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, Aida Todri-Sanial. A body-biasing of readout circuit for STT-RAM with improved thermal reliability. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1530-1533, IEEE, 2015. [doi]

This author has not been identified. Look up 'Lun Yang' in GoogleThis author has not been identified. Look up 'Yuanqing Cheng' in GoogleThis author has not been identified. Look up 'Yuhao Wang' in GoogleThis author has not been identified. Look up 'Hao Yu' in GoogleThis author has not been identified. Look up 'Weisheng Zhao' in GoogleThis author has not been identified. Look up 'Aida Todri-Sanial' in Google

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