Lun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, Aida Todri-Sanial. A body-biasing of readout circuit for STT-RAM with improved thermal reliability. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1530-1533, IEEE, 2015. [doi]
Abstract is missing.