Hao-Yu Yang, Hsin-Wei Hung, Nan-Hsin Tseng. Defect-Finding with Timing-Partitioned Small-Delay-Defect Methodology: Silicon Practice on N2. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 19-26, IEEE, 2025. [doi]
Abstract is missing.