A radiation-hardened DLL with fine resolution and DCC for DDR2 memory interface in 0.13 μm CMOS - researchr publication authors

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Siyu Yang, Deping Huang, Xiaoke Wen, Lei Chen, Jinghong Chen. A radiation-hardened DLL with fine resolution and DCC for DDR2 memory interface in 0.13 μm CMOS. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 1496-1499, IEEE, 2013. [doi]

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