Siyu Yang, Deping Huang, Xiaoke Wen, Lei Chen, Jinghong Chen. A radiation-hardened DLL with fine resolution and DCC for DDR2 memory interface in 0.13 μm CMOS. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 1496-1499, IEEE, 2013. [doi]
@inproceedings{YangHWCC13,
title = {A radiation-hardened DLL with fine resolution and DCC for DDR2 memory interface in 0.13 μm CMOS},
author = {Siyu Yang and Deping Huang and Xiaoke Wen and Lei Chen and Jinghong Chen},
year = {2013},
doi = {10.1109/ISCAS.2013.6572141},
url = {http://dx.doi.org/10.1109/ISCAS.2013.6572141},
researchr = {https://researchr.org/publication/YangHWCC13},
cites = {0},
citedby = {0},
pages = {1496-1499},
booktitle = {2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013},
publisher = {IEEE},
isbn = {978-1-4673-5760-9},
}