Hao-Yu Yang, Shih-Hua Kuo, Tzu-Hsuan Huang, Chi-Hung Chen, Chris Lin, Mango Chia-Tso Chao. Random pattern generation for post-silicon validation of DDR3 SDRAM. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{YangKHCLC15,
title = {Random pattern generation for post-silicon validation of DDR3 SDRAM},
author = {Hao-Yu Yang and Shih-Hua Kuo and Tzu-Hsuan Huang and Chi-Hung Chen and Chris Lin and Mango Chia-Tso Chao},
year = {2015},
doi = {10.1109/VTS.2015.7116287},
url = {http://dx.doi.org/10.1109/VTS.2015.7116287},
researchr = {https://researchr.org/publication/YangKHCLC15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7597-6},
}