NamHyuk Yang, Jinhwan Kim, GeonGu Park, ChulHyuk Kwon, Seungtaek Lee, Sangwoo Pae, Hoosung Kim, Sangwon Hwang. A Study on System Level UFS M-PHY Reliability Measurement Method Using RDVS. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-7, IEEE, 2021. [doi]
Abstract is missing.