Chaofei Yang, Hai Li, Yiran Chen, Jiang Hu. Enhancing Generalization of Wafer Defect Detection by Data Discrepancy-aware Preprocessing and Contrast-varied Augmentation. In 25th Asia and South Pacific Design Automation Conference, ASP-DAC 2020, Beijing, China, January 13-16, 2020. pages 145-150, IEEE, 2020. [doi]
@inproceedings{YangLCH20,
title = {Enhancing Generalization of Wafer Defect Detection by Data Discrepancy-aware Preprocessing and Contrast-varied Augmentation},
author = {Chaofei Yang and Hai Li and Yiran Chen and Jiang Hu},
year = {2020},
doi = {10.1109/ASP-DAC47756.2020.9045391},
url = {https://doi.org/10.1109/ASP-DAC47756.2020.9045391},
researchr = {https://researchr.org/publication/YangLCH20},
cites = {0},
citedby = {0},
pages = {145-150},
booktitle = {25th Asia and South Pacific Design Automation Conference, ASP-DAC 2020, Beijing, China, January 13-16, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4123-7},
}