Chaofei Yang, Hai Li, Yiran Chen, Jiang Hu. Enhancing Generalization of Wafer Defect Detection by Data Discrepancy-aware Preprocessing and Contrast-varied Augmentation. In 25th Asia and South Pacific Design Automation Conference, ASP-DAC 2020, Beijing, China, January 13-16, 2020. pages 145-150, IEEE, 2020. [doi]
Abstract is missing.