Systematic characterization for RF small-signal parameter extraction of 28 nm FDSOI MOSFETs up to 110 GHz

Xuejing Yang, Seungkyeong Lee, Songcheol Hong, Kyounghoon Yang. Systematic characterization for RF small-signal parameter extraction of 28 nm FDSOI MOSFETs up to 110 GHz. Microelectronics Journal, 138:105862, 2023. [doi]

Abstract

Abstract is missing.