Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning - researchr publication

researchr

You are not signed in
Sign in
Sign up

Haoyu Yang, Shuhe Li, Cyrus Tabery, Bingqing Lin, Bei Yu 0001. Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning. IEEE Trans. on CAD of Integrated Circuits and Systems, 40(7):1464-1475, 2021. [doi]

Abstract is missing.

runs on WebDSL