Joon-Sung Yang, Benoit Nadeau-Dostie, Nur A. Touba. Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points. In Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor, editors, 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, 7-9 October 2009, Chicago, Illinois, USA. pages 20-28, IEEE Computer Society, 2009. [doi]
Abstract is missing.