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Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process

Yiming Yang, Jianxin Peng, C. S. Cai, Yadong Zhou, Lei Wang, Jianren Zhang. Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process. Rel. Eng. & Sys. Safety, 217:108105, 2022. [doi]

Authors

Yiming Yang

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Jianxin Peng

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C. S. Cai

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Yadong Zhou

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Lei Wang

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Jianren Zhang

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