Yiming Yang, Jianxin Peng, C. S. Cai, Yadong Zhou, Lei Wang, Jianren Zhang. Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process. Rel. Eng. & Sys. Safety, 217:108105, 2022. [doi]
@article{YangPCZWZ22,
title = {Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process},
author = {Yiming Yang and Jianxin Peng and C. S. Cai and Yadong Zhou and Lei Wang and Jianren Zhang},
year = {2022},
doi = {10.1016/j.ress.2021.108105},
url = {https://doi.org/10.1016/j.ress.2021.108105},
researchr = {https://researchr.org/publication/YangPCZWZ22},
cites = {0},
citedby = {0},
journal = {Rel. Eng. & Sys. Safety},
volume = {217},
pages = {108105},
}