28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications - researchr publication authors

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S.-H. Yang, J. Y. Sheu, M. K. Ieong, M.-H. Chiang, T. Yamamoto, J. J. Liaw, S. S. Chang, Y. M. Lin, T. L. Hsu, J. R. Hwang, J. K. Ting, C. H. Wu, K. C. Ting, F. C. Yang, C. M. Liu, I. L. Wu, Y. M. Chen, S. J. Chent, K. S. Chen, J. Y. Cheng, M.-H. Tsai, W. Chang, R. Chen, C. C. Chen, T. L. Lee, C. K. Lin, S. C. Yang, Y. M. Sheu, J. T. Tzeng, L. C. Lu, S. M. Jang, C. H. Diaz, Yuh-Jier Mii. 28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications. In Rakesh Patel, Tom Andre, Aurangzeb Khan, editors, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011. pages 1-5, IEEE, 2011. [doi]

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